The International Conference on Electron Microscopy and Allied Techniques and XXXVIII Annual Meeting of Electron Microscope Society of India will be jointly organized by Indira Gandhi Centre for Atomic Research, Kalpakkam and the Indian Institute of Technology Madras, Chennai under the aegis of EMSI. This conference will provide a platform for eminent scholars from around the globe to share their knowledge and perspectives on Electron Microscopy and allied techniques.
EMSI – 2017 includes a wide range of topics from Materials Science to Life Sciences. Dedicated sessions will include discussions on advances in SEM, TEM and other complimentary and emerging techniques such as Atom Probe Tomography. Fluorescence. Microscopy SPM, STM, Confocal Microscopy, AFM etc. The scope of the conference includes but is not restricted to,
Advanced Microscopy Techniques: Aberration Corrected TEM & STEM, SEM – FIB, Ion Beam Microscopy, Electron Diffraction & Crystallography, SPM, HREM, OIM, In – Situ and Environmental Microscopy, Microscopy based microanalysis, Cryo Electron Microscopy, 3D-APT, etc.
Application of Microscopy to Novel Materials: Functional Materials, Plasmonics, Thin films and Coatings, Low dimensional Materials, Aperiodic structures, Electronic Materials, Nanomechanics etc. Engineering Materials including behavior under extreme environments.
Bio Nanotechnology Medical Applications: Imaging host – pathogen interaction, brain structure, virology, immuno-electron microscopy and microanalysis Biological Sciences: Application in palaeontology and palaeobiology, flow cytometry and in vivo imaging Geological Materials: Earth and Planetary Materials, Sedimentary and associated rocks, climate research.